TY - JOUR A1 - Chhabra, P. S. A1 - Lambe, A. T. A1 - Canagaratna, M. R. A1 - Stark, H. A1 - Jayne, J. T. A1 - Onasch, T. B. A1 - Davidovits, P. A1 - Kimmel, J. R. A1 - Worsnop, D. R. T1 - Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products JO - Atmos. Meas. Tech. J1 - AMT VL - 8 IS - 1 SP - 1 EP - 18 Y1 - 2015/01/05 PB - Copernicus Publications SN - 1867-8548 UR - https://amt.copernicus.org/articles/8/1/2015/ L1 - https://amt.copernicus.org/articles/8/1/2015/amt-8-1-2015.pdf DO - 10.5194/amt-8-1-2015 ER -