Characterization and correction of OMPS nadir mapper measurements for ozone profile retrievals

Bak, Juseon; Liu, Xiong; Kim, Jae-Hwan; Haffner, David P.; Chance, Kelly; Yang, Kai; Sun, Kang

doi:https://doi.org/10.5194/amt-10-4373-2017

Articles | Volume 10, issue 11

https://doi.org/10.5194/amt-10-4373-2017

© Author(s) 2017. This work is distributed under
the Creative Commons Attribution 4.0 License.

https://doi.org/10.5194/amt-10-4373-2017

© Author(s) 2017. This work is distributed under
the Creative Commons Attribution 4.0 License.

Articles | Volume 10, issue 11

Research article

|

15 Nov 2017

Research article |

| 15 Nov 2017

Characterization and correction of OMPS nadir mapper measurements for ozone profile retrievals

Juseon Bak, Xiong Liu, Jae-Hwan Kim, David P. Haffner, Kelly Chance, Kai Yang, and Kang Sun

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Final revised paper (published on 15 Nov 2017)
Preprint (discussion started on 29 Aug 2017)

Interactive discussion

Status: closed

AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment

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- Supplement

RC1: 'Technical Comment', Glen Jaross, 28 Sep 2017
- AC2: 'Reply to Glen Jaross', Jae H. Kim, 25 Oct 2017
RC2: 'Comments on “Characterization and Correction of OMPS Nadir Mapper Measurements for Ozone Profile Retrievals” by Bak et al.', Anonymous Referee #2, 13 Oct 2017
- AC1: 'Replies to Anonymous Referee #2', Jae H. Kim, 25 Oct 2017

Peer-review completion

AR: Author's response | RR: Referee report | ED: Editor decision

AR by Jae H. Kim on behalf of the Authors (29 Oct 2017)

ED: Publish as is (07 Nov 2017) by Helen Worden

AR by Jae H. Kim on behalf of the Authors (07 Nov 2017)

Short summary

This paper verifies and corrects the Ozone Mapping and Profiler Suite (OMPS) nadir mapper (NM) level 1B v2.0 measurements to retrieve reliable ozone profile and tropospheric ozone using an optimal estimation inversion with the fitting window of 302.5–340 nm. We apply "soft calibration" and "common mode correction" to OMPS radiances to eliminate systematic errors in the fitting residuals and derive random-noise measurement errors accounting for both OMPS radiances and forward model calculation.