Articles | Volume 19, issue 10
https://doi.org/10.5194/amt-19-3491-2026
https://doi.org/10.5194/amt-19-3491-2026
Research article
 | 
27 May 2026
Research article |  | 27 May 2026

Near real-time & benchtop XRF intercomparison for PM elemental analysis on quartz and teflon filters: a case study across three European cities

Stefanos Papagiannis, Manousos I. Manousakas, Dimitrios F. Anagnostopoulos, Michael Pikridas, Rima Baalbaki, Jean Sciare, Niall O'Sullivan, Stig Hellebust, John Wenger, Kirsten N. Fossum, Jurgita Ovadnevaite, Anja Tremper, David Green, Konstantinos Eleftheriadis, and Evangelia Diapouli

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Interactive discussion

Status: closed

Comment types: AC – author | RC – referee | CC – community | EC – editor | CEC – chief editor | : Report abuse
  • RC1: 'Comment on egusphere-2025-5977', Anonymous Referee #1, 13 Feb 2026
    • AC1: 'Reply on RC1', Stefanos Papagiannis, 06 Apr 2026
  • RC2: 'Comment on egusphere-2025-5977', Anonymous Referee #2, 18 Mar 2026
    • AC2: 'Reply on RC2', Stefanos Papagiannis, 06 Apr 2026

Peer review completion

AR – Author's response | RR – Referee report | ED – Editor decision | EF – Editorial file upload
AR by Stefanos Papagiannis on behalf of the Authors (06 Apr 2026)  Author's response   Author's tracked changes   Manuscript 
ED: Referee Nomination & Report Request started (09 Apr 2026) by Jianhuai Ye
RR by Anonymous Referee #1 (20 Apr 2026)
ED: Publish subject to minor revisions (review by editor) (23 Apr 2026) by Jianhuai Ye
AR by Stefanos Papagiannis on behalf of the Authors (24 Apr 2026)  Author's response   Author's tracked changes   Manuscript 
ED: Publish as is (01 May 2026) by Jianhuai Ye
AR by Stefanos Papagiannis on behalf of the Authors (18 May 2026)  Author's response   Manuscript 
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Short summary

We compared near real-time and benchtop XRF spectrometers measuring trace elements in airborne particles across three European cities. Results show filter material dictates accuracy: Teflon yielded strong inter-instrument agreement, while quartz caused systematic attenuation errors for light elements. Because empirical corrections left residual biases, using optimal substrates—preferably Teflon—is essential for accurately tracking pollution sources.

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