Atmospheric Measurement Techniques
Atmospheric Measurement Techniques
AMT
Articles | Volume 19, issue 10
Articles | Volume 19, issue 10
https://doi.org/10.5194/amt-19-3491-2026
© Author(s) 2026. This work is distributed under
the Creative Commons Attribution 4.0 License.
https://doi.org/10.5194/amt-19-3491-2026
© Author(s) 2026. This work is distributed under
the Creative Commons Attribution 4.0 License.
Articles | Volume 19, issue 10
Research article
 | 
27 May 2026
Research article |  | 27 May 2026

Near real-time & benchtop XRF intercomparison for PM elemental analysis on quartz and teflon filters: a case study across three European cities

Stefanos Papagiannis, Manousos I. Manousakas, Dimitrios F. Anagnostopoulos, Michael Pikridas, Rima Baalbaki, Jean Sciare, Niall O'Sullivan, Stig Hellebust, John Wenger, Kirsten N. Fossum, Jurgita Ovadnevaite, Anja Tremper, David Green, Konstantinos Eleftheriadis, and Evangelia Diapouli

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Short summary

We compared near real-time and benchtop XRF spectrometers measuring trace elements in airborne particles across three European cities. Results show filter material dictates accuracy: Teflon yielded strong inter-instrument agreement, while quartz caused systematic attenuation errors for light elements. Because empirical corrections left residual biases, using optimal substrates—preferably Teflon—is essential for accurately tracking pollution sources.

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