Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers
V. Meunier et al.
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
- Printer-friendly version - Supplement
RC C3192: 'Comments to Manuscript amt-2012-202', Anonymous Referee #1, 10 Dec 2012
- AC C4014: 'Final response to reviewer 1 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
RC C3556: 'Review amt-2012-202 by V. Meunier et al.', Anonymous Referee #2, 14 Jan 2013
- AC C4012: 'Final response to reviewer 2 of AMT-2012-202', Véronique Meunier, 25 Feb 2013