Articles | Volume 6, issue 5
Research article
07 May 2013
Research article |  | 07 May 2013

Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers

V. Meunier, U. Löhnert, P. Kollias, and S. Crewell


Interactive discussion

Status: closed
Status: closed
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
Printer-friendly Version - Printer-friendly version Supplement - Supplement