Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers

Articles | Volume 6, issue 5

Atmos. Meas. Tech., 6, 1171–1187, 2013

https://doi.org/10.5194/amt-6-1171-2013

© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.

Atmos. Meas. Tech., 6, 1171–1187, 2013

https://doi.org/10.5194/amt-6-1171-2013

© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.

Articles | Volume 6, issue 5

Research article 07 May 2013

Research article | 07 May 2013

V. Meunier et al.

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RC C3192: 'Comments to Manuscript amt-2012-202', Anonymous Referee #1, 10 Dec 2012
- AC C4014: 'Final response to reviewer 1 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
RC C3556: 'Review amt-2012-202 by V. Meunier et al.', Anonymous Referee #2, 14 Jan 2013
- AC C4012: 'Final response to reviewer 2 of AMT-2012-202', Véronique Meunier, 25 Feb 2013