Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers
V. Meunier et al.
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- Final revised paper (published on 07 May 2013)
- Preprint (discussion started on 01 Nov 2012)
Interactive discussion
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment


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RC C3192: 'Comments to Manuscript amt-2012-202', Anonymous Referee #1, 10 Dec 2012
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AC C4014: 'Final response to reviewer 1 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
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AC C4014: 'Final response to reviewer 1 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
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RC C3556: 'Review amt-2012-202 by V. Meunier et al.', Anonymous Referee #2, 14 Jan 2013
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AC C4012: 'Final response to reviewer 2 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
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AC C4012: 'Final response to reviewer 2 of AMT-2012-202', Véronique Meunier, 25 Feb 2013