Articles | Volume 6, issue 5
Atmos. Meas. Tech., 6, 1171–1187, 2013
https://doi.org/10.5194/amt-6-1171-2013
Atmos. Meas. Tech., 6, 1171–1187, 2013
https://doi.org/10.5194/amt-6-1171-2013
Research article
07 May 2013
Research article | 07 May 2013

Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers

V. Meunier et al.

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