Articles | Volume 6, issue 5
https://doi.org/10.5194/amt-6-1171-2013
https://doi.org/10.5194/amt-6-1171-2013
Research article
 | 
07 May 2013
Research article |  | 07 May 2013

Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers

V. Meunier, U. Löhnert, P. Kollias, and S. Crewell

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