High-resolution temperature profiling in the Π Chamber: variability of statistical properties of temperature fluctuations

Grosz, Robert; Chandrakar, Kamal Kant; Shaw, Raymond A.; Anderson, Jesse C.; Cantrell, Will; Malinowski, Szymon P.

doi:https://doi.org/10.5194/amt-18-2619-2025

Articles | Volume 18, issue 12

https://doi.org/10.5194/amt-18-2619-2025

© Author(s) 2025. This work is distributed under
the Creative Commons Attribution 4.0 License.

https://doi.org/10.5194/amt-18-2619-2025

© Author(s) 2025. This work is distributed under
the Creative Commons Attribution 4.0 License.

Articles | Volume 18, issue 12

Research article

|

20 Jun 2025

Research article |

| 20 Jun 2025

High-resolution temperature profiling in the Π Chamber: variability of statistical properties of temperature fluctuations

Robert Grosz, Kamal Kant Chandrakar, Raymond A. Shaw, Jesse C. Anderson, Will Cantrell, and Szymon P. Malinowski

Data sets

High-resolution temperature profiling in the Π Chamber: variability of statistical properties of temperature fluctuations Robert Grosz et al. https://doi.org/10.37099/mtu.dc.all-datasets/58

Short summary

Our objective was to enhance understanding of thermally driven convection in terms of small-scale variations in the temperature scalar field. We conducted a small-scale study of the temperature field in the Π Chamber using three different temperature differences (10 K, 15 K, and 20 K). Measurements were carried out using a miniaturized UltraFast Thermometer operating at 2 kHz, allowing undisturbed vertical temperature profiling from 8 cm above the floor to 5 cm below the ceiling.