Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

Chhabra, P. S.; Lambe, A. T.; Canagaratna, M. R.; Stark, H.; Jayne, J. T.; Onasch, T. B.; Davidovits, P.; Kimmel, J. R.; Worsnop, D. R.

doi:https://doi.org/10.5194/amt-8-1-2015

Articles | Volume 8, issue 1

Atmos. Meas. Tech., 8, 1–18, 2015

https://doi.org/10.5194/amt-8-1-2015

© Author(s) 2015. This work is distributed under
the Creative Commons Attribution 3.0 License.

Atmos. Meas. Tech., 8, 1–18, 2015

https://doi.org/10.5194/amt-8-1-2015

© Author(s) 2015. This work is distributed under
the Creative Commons Attribution 3.0 License.

Articles | Volume 8, issue 1

Research article 05 Jan 2015

Research article | 05 Jan 2015

Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

P. S. Chhabra et al.

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Final revised paper (published on 05 Jan 2015)
Supplement to the final revised paper
Preprint (discussion started on 01 Jul 2014)
Supplement to the preprint

Interactive discussion

Status: closed

AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment

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- Supplement

RC C1943: 'Review of "Chemistry of a-pinene and naphthalene oxidation products generated in a potential aerosol mass (PAM) chamber as measured by acetate chemical ionization mass spectrometry"', Anonymous Referee #2, 29 Jul 2014
RC C2043: 'Review', Anonymous Referee #1, 05 Aug 2014
AC C2879: 'Response to Referee Comments', Puneet Chhabra, 24 Sep 2014

Short summary

Authors of this publication used acetate chemical ionization mass spectrometry (acetate-CIMS) to measure experimental products of alpha-pinene and naphthalene oxidation formed in a flow reactor. Acetate-CIMS instrumentation is selective toward carboxylic acid compounds which are readily formed in atmospheric photooxidation processes. Spectral information was used to identify previously measured products of both systems and to estimate their volatilities.