Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

Chhabra, P. S.; Lambe, A. T.; Canagaratna, M. R.; Stark, H.; Jayne, J. T.; Onasch, T. B.; Davidovits, P.; Kimmel, J. R.; Worsnop, D. R.

doi:https://doi.org/10.5194/amt-8-1-2015

Volume 8, issue 1

Atmos. Meas. Tech., 8, 1–18, 2015
https://doi.org/10.5194/amt-8-1-2015
© Author(s) 2015. This work is distributed under
the Creative Commons Attribution 3.0 License.

Volume 8, issue 1

Research article 05 Jan 2015

Research article | 05 Jan 2015

Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

P. S. Chhabra et al.

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Final revised paper (published on 05 Jan 2015)
Supplement to the final revised paper
Preprint (discussion started on 01 Jul 2014)
Supplement to the preprint

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Status: closed

AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment

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- Supplement

RC C1943: 'Review of "Chemistry of a-pinene and naphthalene oxidation products generated in a potential aerosol mass (PAM) chamber as measured by acetate chemical ionization mass spectrometry"', Anonymous Referee #2, 29 Jul 2014
RC C2043: 'Review', Anonymous Referee #1, 05 Aug 2014
AC C2879: 'Response to Referee Comments', Puneet Chhabra, 24 Sep 2014

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Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

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Interactive discussion