Research article
05 Jan 2015
Research article | 05 Jan 2015
Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products
P. S. Chhabra et al.
Interactive discussion
Status: closed
Status: closed
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
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