Articles | Volume 8, issue 1
Atmos. Meas. Tech., 8, 1–18, 2015
Atmos. Meas. Tech., 8, 1–18, 2015
Research article
05 Jan 2015
Research article | 05 Jan 2015

Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products

P. S. Chhabra et al.

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Cited articles

Aiken, A. C., DeCarlo, P. F., and Jimenez, J. L.: Elemental Analysis of Organic Species with Electron Ionization High-Resolution Mass Spectrometry, Anal. Chem., 79, 8350–8358,, 2007.
Aljawhary, D., Lee, A. K. Y., and Abbatt, J. P. D.: High-resolution chemical ionization mass spectrometry (ToF-CIMS): application to study SOA composition and processing, Atmos. Meas. Tech., 6, 3211–3224,, 2013.
Atkinson, R. and Aschmann, S. M.: Kinetics of the reactions of naphthalene, 2-methylnaphthalene, and 2,3-dimethylnaphthalene with OH radicals and with O3 at 295 ± 1 K, Int. J. Chem. Kinet., 18, 569–573,, 1986.
Barley, M. H. and McFiggans, G.: The critical assessment of vapour pressure estimation methods for use in modelling the formation of atmospheric organic aerosol, Atmos. Chem. Phys., 10, 749–767,, 2010.
Short summary
Authors of this publication used acetate chemical ionization mass spectrometry (acetate-CIMS) to measure experimental products of alpha-pinene and naphthalene oxidation formed in a flow reactor. Acetate-CIMS instrumentation is selective toward carboxylic acid compounds which are readily formed in atmospheric photooxidation processes. Spectral information was used to identify previously measured products of both systems and to estimate their volatilities.